|
TITLE(s): INSPECTOR, PLATING (electroplating) alternate titles: sample tester Inspects plated surfaces of metal or plastic objects visually or using chemical or electrical tests: Examines part for defects, such as uneven coating or scratches. Applies chemicals to or immerses object in test solution and observes reaction or measures dissolving time. Turns on electrical current and reads gauge to measure plating thickness. Attaches magnet to metal part and reads gauge to measure magnet pull to determine plating thickness. Compares readings with specifications and returns defective objects for rework. May test samples of electrolytic solutions. GOE: 06.03.01 STRENGTH: M GED: R3 M3 L3 SVP: 3 DLU: 77 ONET CROSSWALK: 83005A Production Inspectors, Testers, Graders, Sorters, Samplers, Weighers |
Language Translations | | Espaρol | Children | Lawyers | E-mail "Immigration Superhighway", "Immigration Central", "Immigration Assistant", "Immigration Expert", "Immigration Expert Pro" and "Immigration USA" are trademarks of Information Technology Associates.
© 1995 - 2015 Photius Coutsoukis and Information
Technology Associates (All Rights Reserved).
|
Previous Next Contents ONET About
CODE: 500.287-010 Buy the DOT: Download
TITLE(s):
INSPECTOR, PLATING (electroplating) alternate titles: sample tester
Inspects plated surfaces of metal or plastic objects visually or using chemical or electrical
tests: Examines part for defects, such as uneven coating or scratches. Applies chemicals to or
immerses object in test solution and observes reaction or measures dissolving time. Turns on
electrical current and reads gauge to measure plating thickness. Attaches magnet to metal part and
reads gauge to measure magnet pull to determine plating thickness. Compares readings with
specifications and returns defective objects for rework. May test samples of electrolytic solutions.
GOE: 06.03.01 STRENGTH: M GED: R3 M3 L3 SVP: 3 DLU: 77
ONET CROSSWALK: 83005A Production Inspectors, Testers, Graders, Sorters, Samplers, Weighers
© 1995 - 2015 Photius Coutsoukis and Information Technology Associates (All Rights Reserved). Revised 26-May-03